Measuring assembly and method for measuring a three-dimensionally extended structure

Measuring assembly and method for measuring a three-dimensionally extended structure

The arrangement (1) has a mirror arrangement (3) with multiple mirrors (9, 12, 13) that divides a measuring region (5) of an optical sensor into two diverging regions (10, 11) about the mirror (9). The mirrors (9, 12, 13) reunite the diverging regions about the two mirrors (12, 13) in such a manner...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SCHUELLER, TOBIAS, STAUTMEISTER, TORSTEN
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:The arrangement (1) has a mirror arrangement (3) with multiple mirrors (9, 12, 13) that divides a measuring region (5) of an optical sensor into two diverging regions (10, 11) about the mirror (9). The mirrors (9, 12, 13) reunite the diverging regions about the two mirrors (12, 13) in such a manner that reflective regions (14, 15) are intersected in a measuring field (16), where a measurement of a three-dimensional extended structure is effected in the measuring field. A telecentric lens is assigned to the optical sensor. An independent claim is also included for a method for measuring a three-dimensionally extended structure.