METHOD OF MEASURING FILM THICKNESS OF SURFACE OXIDE FILM OF ZINC-BASED PLATED STEEL SHEET

It is a main object of the present invention to provide a technique for promptly and accurately measuring the thickness of an oxide film that has a thickness in the range of 10 nm to 100 nm and is formed on a galvanized steel sheet. Furthermore, it is another main object of the present invention to...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	TAIRA, SHOICHIRO, NAGOSHI, MASAYASU, SUGIMOTO, YOSHIHARU, NORO, HISATO, SATO, SHIGEOMI
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	It is a main object of the present invention to provide a technique for promptly and accurately measuring the thickness of an oxide film that has a thickness in the range of 10 nm to 100 nm and is formed on a galvanized steel sheet. Furthermore, it is another main object of the present invention to evaluate the press formability of a galvanized steel sheet including the oxide film on the basis of the measured thickness of the oxide film. A method for measuring the thickness of an oxide film formed on a galvanized steel sheet, comprising: irradiating the galvanized steel sheet with an electron beam accelerated to 3-6 kV using an electron probe micro analyzer or a scanning electron microscope equipped with a wavelength dispersive X-ray detector; and measuring the intensity of generated oxygen K± X-rays with the detector and a subsequent pulse height analyzer to eliminate the effect of second order zinc L± and L² X-rays.