Method for marking defect and device therefor

The defect marking method comprises the steps of: installing a surface defect tester (3) to detect surface flaw and a marker device (8) to apply marking at defect position, in a continuous processing line o steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester (3...

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Bibliographische Detailangaben
Hauptverfasser: UESUGI, MITSUAKI, HARADA, KOZO, YOSHIKAWA, SHOJI, KAWAMURA, TSUTOMU, KANETO, SHUJI, OSHIGE, TAKAHIKO, KUSHIDA, YASUO, TOMONAGA, SHINICHI, SUGIURA, HIROYUKI, SUYAMA, TSUNEO, UEHARA, OSAMU, IWABUCHI, MASAHIRO, TANAKA, HAJIME, INOMATA, MASAICHI, FUKUDA, SHIGEMI, HARADA, SHUICHI, KAZAMA, AKIRA
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:The defect marking method comprises the steps of: installing a surface defect tester (3) to detect surface flaw and a marker device (8) to apply marking at defect position, in a continuous processing line o steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester (3); determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect. injudgicable defect, and harmless defect; applying tracking of the defect position for: each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device (1) comprises a defect inspection means (140,140a) having plurality of light-receiving parts (132a) and a signal processing section (130), and a marking means (144).