METHOD AND APPARATUS OF SIGNAL PROCESSING IN SPECTROMETRY USING AN IMPROVED APODIZATION FUNCTION

METHOD AND APPARATUS OF SIGNAL PROCESSING IN SPECTROMETRY USING AN IMPROVED APODIZATION FUNCTION

A method and apparatus is disclosed for signal spectrometry using an improved apodization function. Such method and apparatus involve (i) obtaining sample and reference time domain waveforms; (ii) applying sample and reference apodization waveforms to the sample and reference time domain waveforms,...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: NEIRA, JORGE, E, KAMLET, LEONARD, I, MARSHIK-GEURTS, BARBARA, J, MARRAN, DAVID, F
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Beschreibung
Zusammenfassung:A method and apparatus is disclosed for signal spectrometry using an improved apodization function. Such method and apparatus involve (i) obtaining sample and reference time domain waveforms; (ii) applying sample and reference apodization waveforms to the sample and reference time domain waveforms, such that substantially same weight is applied to corresponding substantially coextensive regions of the sample and reference time domain waveforms, (iii) transforming the sample and reference apodized waveforms from the time domain into the frequency domain; and (iv) generating referenced spectral analysis waveform for signal analysis from a ratio of the transformed sample and reference frequency spectra, the spectral analysis waveform substantially excluding frequencies associated with the corresponding substantially coextensive regions of the apodized sample and reference time domain waveforms.