PROCESS AND DEVICE FOR EXAMINING THE MATERIAL PROPERTIES OF AT LEAST ONE OF TWO SAMPLES MOVED RELATIVE TO ONE ANOTHER

PROCESS AND DEVICE FOR EXAMINING THE MATERIAL PROPERTIES OF AT LEAST ONE OF TWO SAMPLES MOVED RELATIVE TO ONE ANOTHER

A process is disclosed for examining the material properties of at least one of two samples (1a, 3a) moved relative to one another and to which a perpendicular force is applied. Enhanced measurement precision can be achieved in that the perpendicular force is contactlessly applied by at least one ma...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: WASSERMANN, JOHANN
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A process is disclosed for examining the material properties of at least one of two samples (1a, 3a) moved relative to one another and to which a perpendicular force is applied. Enhanced measurement precision can be achieved in that the perpendicular force is contactlessly applied by at least one magnetic field or at least one gas or fluid stream to a sample element (1a, 3a), its holder (1b, 3b) or its guide system (5, 6).