$Method for automatically aligning a sample in an x-ray diffractometer$

Method for automatically aligning a sample in an x-ray diffractometer

Method for aligning a sample comprising a crystal for X-ray crystallographic analysis, which sample is mounted on a positioning device. A camera is provided for automatically adjusting the position of the sample.

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Bibliographische Detailangaben
Hauptverfasser:	OLSON, JEFFREY, A, PAN, JEFFREY, Y, NIENABER, VICKI, L, MUCHMORE, STEVEN, W, GREER, JONATHAN, JONES, RONALD, B
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	Method for aligning a sample comprising a crystal for X-ray crystallographic analysis, which sample is mounted on a positioning device. A camera is provided for automatically adjusting the position of the sample.