INTEGRATED CIRCUIT SELECTIVE SCALING

The invention includes a solution for selectively scaling an integrated circuit (IC) design by: layer, region or cell, or a combination of these. The selective scaling technique can be applied in a feedback loop with the manufacturing system with process and yield feedback, during the life of a desi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MCCULLEN, KEVIN, W, RUNYON, STEPHEN, L, WALKER, ROBERT, F, HIBBELER, JASON, D, HENG, FOOK-LUEN, NARAYAN, RANI, R
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:The invention includes a solution for selectively scaling an integrated circuit (IC) design by: layer, region or cell, or a combination of these. The selective scaling technique can be applied in a feedback loop with the manufacturing system with process and yield feedback, during the life of a design, to increase yield in early processes in such a way that hierarchy is preserved. The invention removes the need to involve designers in improving yield.