INSTRUMENT MOUNTING SYSTEM WITH DUAL ENCODERS

The present invention provides a way to measure the position of an instrument that is mounted on an instrument shaft within a clutched mounting system, the instrument shaft being driven through a reduction gearbox by a motor shaft. The position of the instrument is measured as a function of the posi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	CHEN, JACK, CHIN, CHUAN, LIU, NAI, CHANG
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The present invention provides a way to measure the position of an instrument that is mounted on an instrument shaft within a clutched mounting system, the instrument shaft being driven through a reduction gearbox by a motor shaft. The position of the instrument is measured as a function of the position of the motor shaft and the position of the instrument shaft, the measurement of the position of the motor shaft providing greater precision than the position of the instrument shaft. Because the mounting system is clutched, it is necessary to check at intervals whether the measurement of the motor shaft position no longer accurately represents the position of the instrument, in which case the measurement of the motor shaft position is resynchronized to the measurement of the instrument shaft.