Device for measuring the geometry and evenness of a metal band

Device for measuring the geometry and evenness of a metal band

The system has a light source and a camera (2) and produces a pattern on the measurement surface. The pattern can be produced by a projection (3) with the aid of a transparency. A variable pattern may be produced using a liquid crystal device. An independent claim is also included for a method of me...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WINTER, DETLEF, MUELLER, ULRICH, SONNENSCHEIN, DETLEF, STOCKMEYER, RUDOLF, PAUKER, GUSTAV
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:The system has a light source and a camera (2) and produces a pattern on the measurement surface. The pattern can be produced by a projection (3) with the aid of a transparency. A variable pattern may be produced using a liquid crystal device. An independent claim is also included for a method of measuring strip geometry.