ELLIPSOMETRIC BIOSENSOR COMPRISING AN AMPLIFICATION LAYER

A method for analyzing organic adsorbent layers ( 7 ) on a substrate ( 4 ) comprises the steps of providing a substrate ( 4 ) whose surface has an index of refraction equal or close to the index of refraction of the organic adsorbent to be analyzed. On the surface of the substrate ( 4 ) there is app...

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Bibliographische Detailangaben
Hauptverfasser:	EDLINGER, JOHANNES, HOENIG, DIRK, WIKI, MAX, EING, ANDREAS
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A method for analyzing organic adsorbent layers ( 7 ) on a substrate ( 4 ) comprises the steps of providing a substrate ( 4 ) whose surface has an index of refraction equal or close to the index of refraction of the organic adsorbent to be analyzed. On the surface of the substrate ( 4 ) there is applied a layer system ( 5,6 ) with at least one layer ( 5 ) with index of refraction of the biological material and an organic adsorbent layer ( 7 ) on top of the layer system. When acting polarized light upon the substrate a change of polarization characteristics in reflection and/or transmission is detected.