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An apparatus for analyzing a plurality of samples in sample sites on a substrate, the apparatus having an array of spaced apart light sources coupled to a moveable support so that one or more of the light sources can be selectively used; a frame for supporting the substrate; a detector configured to...

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Bibliographische Detailangaben
Hauptverfasser:	ATZLER, JOSEPH, KATZLINGER, MICHAEL, ALARURI, SAMI D
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	An apparatus for analyzing a plurality of samples in sample sites on a substrate, the apparatus having an array of spaced apart light sources coupled to a moveable support so that one or more of the light sources can be selectively used; a frame for supporting the substrate; a detector configured to detect light; an optical relay configured to transmit light from at least one of the plurality of light sources to a sample site and from the sample site to the detector; and a support structure for supporting the frame, the detector and the optical relay.