LITHOGRAPHIC SYSTEMS AND METHODS WITH EXTENDED DEPTH OF FOCUS

Apparatus for increasing the depth of focus in a lithographic system, comprising: optics for imaging a reticle or photomask onto a lithographic recording medium having a threshold of exposure; a pupil plane function that alters the aerial image of the lithographic imaging system such that part of th...

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Bibliographische Detailangaben
Hauptverfasser:	DOWSKI, EDWARD, RAYMOND, JR, JOHNSON, GREGORY, E, WADE, THOMAS, CATHEY, JR, KUBALA, KENNETH, SCOTT
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ACCESSORIES THEREFOR APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM APPARATUS SPECIALLY ADAPTED THEREFOR CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY MATERIALS THEREFOR OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS
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Beschreibung
Zusammenfassung:	Apparatus for increasing the depth of focus in a lithographic system, comprising: optics for imaging a reticle or photomask onto a lithographic recording medium having a threshold of exposure; a pupil plane function that alters the aerial image of the lithographic imaging system such that part of the aerial image is above a recording threshold of the lithographic recording medium over the extended depth of focus, the pupil plane function altering a system response function and the aerial image by affecting phase of a wavefront imaged by the optics.