METHOD OF ANALYZING A CATALYTIC LAYER

A filter catalyst of the present is characterized in that , in a filter catalyst comprising: a catalyst-support substrate; and a catalytic layer; an SEM photograph on a cross section of the filter catalyst is turned into electronic data so that, in a processed image in which image processing is perf...

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Bibliographische Detailangaben
Hauptverfasser: TSUJI, MAKOTO, OKI, DAISUKE, SUZUKI, JUJI
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:A filter catalyst of the present is characterized in that , in a filter catalyst comprising: a catalyst-support substrate; and a catalytic layer; an SEM photograph on a cross section of the filter catalyst is turned into electronic data so that, in a processed image in which image processing is performed to the SEM photograph, a ratio of a number of pixels forming an outer periphery of the catalytic layer to a number of pixels forming the catalytic layer is 0.5 or more. An analyzing method of the present invention finds a ratio a number of pixels forming an outer periphery of the catalytic layer to a number of pixels forming the catalytic layer by performing image processing to a cross section of the filter catalyst. The filter catalyst of the present invention has an effect of being capable of inhibiting the rise of pressure loss when sufficient particulates deposit. Moreover, the analyzing method of the present invention can analyze the uniformity of the catalytic layer of the filter catalyst.