METHOD AND APPARATUS FOR SHIFTING AT-SPEED SCAN PATTERNS IN A SCAN-BASED INTEGRATED CIRCUIT

METHOD AND APPARATUS FOR SHIFTING AT-SPEED SCAN PATTERNS IN A SCAN-BASED INTEGRATED CIRCUIT

A method and apparatus time-division demultiplexes and decompresses a compressed input stimulus provided at a selected data rate R1, into a decompressed stimulus, driven at a selected data rate R2, for driving selected scan chains in a scan-based integrated circuit using a plurality of time-division...

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Bibliographische Detailangaben
Hauptverfasser: WANG, LAUNG-TERNG, WEN, XIAOQING, SHEU, BORYAU, JACK, WANG, SHUN-MIIN (SAM), LIN, SHYH-HORNG, ABDEL-HAFEZ, KHADER, S, CHANG, MING-TUNG, HSU, FEI-SHENG, WU, SHIANLING, KIFLI, AUGUSLI
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRIC DIGITAL DATA PROCESSING
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
MULTIPLEX COMMUNICATION
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A method and apparatus time-division demultiplexes and decompresses a compressed input stimulus provided at a selected data rate R1, into a decompressed stimulus, driven at a selected data rate R2, for driving selected scan chains in a scan-based integrated circuit using a plurality of time-division demultiplexors and time-division multiplexors for shifting stimuli and test responses in and out of high-speed I/O pads in order to reduce test time, test cost, and scan pin count. A synthesis method is also proposed for synthesizing the time-division multiplexors, decompressors, compressors, and time-division multiplexors.