INSTRUMENTATION, ARTICLES OF MANUFACTURE, AND ANALYSIS METHODS

INSTRUMENTATION, ARTICLES OF MANUFACTURE, AND ANALYSIS METHODS

Analysis methods are provided that include generating a sample data set using a sample, the sample data set comprising first and second data sets, wherein each of the first and second data sets comprises at least one of an analytical parameter and a sample characteristic acquired using the analytica...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: BARKET, DENNIS, WELLS, JAMES, MITCHELL
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
BASIC ELECTRIC ELEMENTS
COLORIMETRY
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Beschreibung
Zusammenfassung:Analysis methods are provided that include generating a sample data set using a sample, the sample data set comprising first and second data sets, wherein each of the first and second data sets comprises at least one of an analytical parameter and a sample characteristic acquired using the analytical parameter; and using the first and the second data sets, identifying the sample. Instruments including an ionization source configured to apply different ionization energies to a sample to provide different sample characteristics, and processing circuitry configured to process the different sample characteristics to identify the sample are provided.