Detachable probing tip system for a measurement probing system

A attachable/detachable probing tip system has a housing that includes a probing tip mounting member and opposing substantially orthogonal attachment arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is dispos...

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Bibliographische Detailangaben
Hauptverfasser:	LAW, WILLIAM Q, MARTIN, JIM L, HAGERUP, WILLIAM A, GESSFORD, MARC A, POOLEY, WILLIAM R, POLLOCK, IRA G
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS CURRENT COLLECTORS ELECTRICITY LINE CONNECTORS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A attachable/detachable probing tip system has a housing that includes a probing tip mounting member and opposing substantially orthogonal attachment arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is disposed at least a first a non-compressive set, resilient member. First and second probing tips are disposed over the non-compressive, resilient member and secured to the housing by latching means. The attachable/detachable probing tip system allows mounting of the probing tips to probing contacts on a device under test without a measurement probe being attached. The attachment arms allows a measurement probe to be attached and detached to the probing tip system.