Method and apparatus for X-ray analysis with a two-dimensional array-detector
A process for operating an X-ray analysis machine with an X-ray source (17) and a flat two dimensional array detector with pixel elements (7), comprises obtaining a first data set with the object being examined in a particular position relative to the object and detector. The detector is then moved...
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| Format: | Patent |
| Sprache: | eng ; fre ; ger |
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| Zusammenfassung: | A process for operating an X-ray analysis machine with an X-ray source (17) and a flat two dimensional array detector with pixel elements (7), comprises obtaining a first data set with the object being examined in a particular position relative to the object and detector. The detector is then moved relative to the source and a second data set is obtained. The two data sets are then used to obtain a common data set and the pixels are combined. |
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