Combining multiple independent sources of information for classification of devices under test

Combining multiple independent sources of information for classification of devices under test

Embodiments of the present invention use the results of a plurality of defect detecting tests (102-105) and adjust the result of each test in a manner that reflects the accuracy of the test that produced it. A manufactured unit (101) can then be evaluated using a mathematical combination of the adju...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LI, JONATHAN QUIANG, USIKOV, DANIEL A
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Embodiments of the present invention use the results of a plurality of defect detecting tests (102-105) and adjust the result of each test in a manner that reflects the accuracy of the test that produced it. A manufactured unit (101) can then be evaluated using a mathematical combination of the adjusted results.