QUANTITATIVE PHASE ANALYSIS OF TEXTURED POLYCRYSTALLINE MATERIALS

A method for quantitatively determining the phase composition of a sample mixture that comprises two or more textured polycrystalline materials, based on corrected and integrated x-ray diffraction intensities. The effect of texture has been analytically eliminated from such corrected and integrated...

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Hauptverfasser: KURTZ, DAVID, S, MORAN, PAUL, R, MARTIN, ROGER, I, KOZACZEK, KRZYSZTOF, J
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:A method for quantitatively determining the phase composition of a sample mixture that comprises two or more textured polycrystalline materials, based on corrected and integrated x-ray diffraction intensities. The effect of texture has been analytically eliminated from such corrected and integrated x-ray diffraction intensities, based on the texture information obtained from the sample mixture.