Pulsed eddy current sensor probes and inspection methods
A pulsed eddy current sensor probe (10) includes a sensor array board (12). A number of sensors (14) are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part (20) being inspected. Each of the sensors has a differen...
Gespeichert in:
| Hauptverfasser: | , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre ; ger |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | HERD, KENNETH GORDON NATH, SHRIDHAR CHAMPAKNATH PLOTNIKOV, YURI ALEXEYEVICH ROSE, CURTIS WAYNE BATZINGER, THOMAS JAMES LESTER, CARL STEPHEN DEWANGAN, SANDEEP KUMAR |
| description | A pulsed eddy current sensor probe (10) includes a sensor array board (12). A number of sensors (14) are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part (20) being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil (16) is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer (18, 19) are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP1538441B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP1538441B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP1538441B13</originalsourceid><addsrcrecordid>eNrjZLAIKM0pTk1RSE1JqVRILi0qSs0rUShOzSvOL1IoKMpPSi1WSMxLUcjMKy5ITS7JzM9TyE0tychPKeZhYE1LBGrlhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BhqbGFiYmhk6GxkQoAQDRny47</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Pulsed eddy current sensor probes and inspection methods</title><source>esp@cenet</source><creator>HERD, KENNETH GORDON ; NATH, SHRIDHAR CHAMPAKNATH ; PLOTNIKOV, YURI ALEXEYEVICH ; ROSE, CURTIS WAYNE ; BATZINGER, THOMAS JAMES ; LESTER, CARL STEPHEN ; DEWANGAN, SANDEEP KUMAR</creator><creatorcontrib>HERD, KENNETH GORDON ; NATH, SHRIDHAR CHAMPAKNATH ; PLOTNIKOV, YURI ALEXEYEVICH ; ROSE, CURTIS WAYNE ; BATZINGER, THOMAS JAMES ; LESTER, CARL STEPHEN ; DEWANGAN, SANDEEP KUMAR</creatorcontrib><description>A pulsed eddy current sensor probe (10) includes a sensor array board (12). A number of sensors (14) are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part (20) being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil (16) is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer (18, 19) are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively.</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120815&DB=EPODOC&CC=EP&NR=1538441B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120815&DB=EPODOC&CC=EP&NR=1538441B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HERD, KENNETH GORDON</creatorcontrib><creatorcontrib>NATH, SHRIDHAR CHAMPAKNATH</creatorcontrib><creatorcontrib>PLOTNIKOV, YURI ALEXEYEVICH</creatorcontrib><creatorcontrib>ROSE, CURTIS WAYNE</creatorcontrib><creatorcontrib>BATZINGER, THOMAS JAMES</creatorcontrib><creatorcontrib>LESTER, CARL STEPHEN</creatorcontrib><creatorcontrib>DEWANGAN, SANDEEP KUMAR</creatorcontrib><title>Pulsed eddy current sensor probes and inspection methods</title><description>A pulsed eddy current sensor probe (10) includes a sensor array board (12). A number of sensors (14) are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part (20) being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil (16) is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer (18, 19) are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAIKM0pTk1RSE1JqVRILi0qSs0rUShOzSvOL1IoKMpPSi1WSMxLUcjMKy5ITS7JzM9TyE0tychPKeZhYE1LBGrlhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BhqbGFiYmhk6GxkQoAQDRny47</recordid><startdate>20120815</startdate><enddate>20120815</enddate><creator>HERD, KENNETH GORDON</creator><creator>NATH, SHRIDHAR CHAMPAKNATH</creator><creator>PLOTNIKOV, YURI ALEXEYEVICH</creator><creator>ROSE, CURTIS WAYNE</creator><creator>BATZINGER, THOMAS JAMES</creator><creator>LESTER, CARL STEPHEN</creator><creator>DEWANGAN, SANDEEP KUMAR</creator><scope>EVB</scope></search><sort><creationdate>20120815</creationdate><title>Pulsed eddy current sensor probes and inspection methods</title><author>HERD, KENNETH GORDON ; NATH, SHRIDHAR CHAMPAKNATH ; PLOTNIKOV, YURI ALEXEYEVICH ; ROSE, CURTIS WAYNE ; BATZINGER, THOMAS JAMES ; LESTER, CARL STEPHEN ; DEWANGAN, SANDEEP KUMAR</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP1538441B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2012</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HERD, KENNETH GORDON</creatorcontrib><creatorcontrib>NATH, SHRIDHAR CHAMPAKNATH</creatorcontrib><creatorcontrib>PLOTNIKOV, YURI ALEXEYEVICH</creatorcontrib><creatorcontrib>ROSE, CURTIS WAYNE</creatorcontrib><creatorcontrib>BATZINGER, THOMAS JAMES</creatorcontrib><creatorcontrib>LESTER, CARL STEPHEN</creatorcontrib><creatorcontrib>DEWANGAN, SANDEEP KUMAR</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HERD, KENNETH GORDON</au><au>NATH, SHRIDHAR CHAMPAKNATH</au><au>PLOTNIKOV, YURI ALEXEYEVICH</au><au>ROSE, CURTIS WAYNE</au><au>BATZINGER, THOMAS JAMES</au><au>LESTER, CARL STEPHEN</au><au>DEWANGAN, SANDEEP KUMAR</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Pulsed eddy current sensor probes and inspection methods</title><date>2012-08-15</date><risdate>2012</risdate><abstract>A pulsed eddy current sensor probe (10) includes a sensor array board (12). A number of sensors (14) are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part (20) being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil (16) is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer (18, 19) are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre ; ger |
| recordid | cdi_epo_espacenet_EP1538441B1 |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Pulsed eddy current sensor probes and inspection methods |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T22%3A15%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HERD,%20KENNETH%20GORDON&rft.date=2012-08-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP1538441B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |