Pulsed eddy current sensor probes and inspection methods

A pulsed eddy current sensor probe (10) includes a sensor array board (12). A number of sensors (14) are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part (20) being inspected. Each of the sensors has a differen...

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Bibliographische Detailangaben
Hauptverfasser:	HERD, KENNETH GORDON, NATH, SHRIDHAR CHAMPAKNATH, PLOTNIKOV, YURI ALEXEYEVICH, ROSE, CURTIS WAYNE, BATZINGER, THOMAS JAMES, LESTER, CARL STEPHEN, DEWANGAN, SANDEEP KUMAR
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A pulsed eddy current sensor probe (10) includes a sensor array board (12). A number of sensors (14) are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part (20) being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil (16) is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer (18, 19) are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively.