Signal pre-processing for estimating attributes of a transmission line

The reflectometry measurements of transmission line is performed, to determine one-port scattering parameter of the line in reference impedance base. The one-port scattering parameter is converted to an estimated characteristic impedance base, to yield an one-port scattering parameter with residual...

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Bibliographische Detailangaben
Hauptverfasser: BOETS, PATRICK JAN MARIA, VAN BIESEN, LEONARD PIERRE, BOSTOEN, TOM, POLLET, THIERRY
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:The reflectometry measurements of transmission line is performed, to determine one-port scattering parameter of the line in reference impedance base. The one-port scattering parameter is converted to an estimated characteristic impedance base, to yield an one-port scattering parameter with residual near end reflections. A time zone is determined to enclose the reflections, and is neutralized. An independent claim is also included for an apparatus to estimate attributes of a transmission line.