Apertured probes for localized measurements of a material's complex permittivity and fabrication method

A pair of conductive strips (13,14) arranged in parallel in a multiconductor transmission line (12), are extended along a cladding layer (15) of a dielectric support portion (21). An independent claim is also included for dielectric support-based probe manufacturing method.

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Bibliographische Detailangaben
Hauptverfasser:	MORELAND, ROBERT L, CHRISTEN, HANS M, TALANOV, VLADIMIR V, SCHWARTZ, ANDREW R
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TESTING
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Beschreibung
Zusammenfassung:	A pair of conductive strips (13,14) arranged in parallel in a multiconductor transmission line (12), are extended along a cladding layer (15) of a dielectric support portion (21). An independent claim is also included for dielectric support-based probe manufacturing method.