Method for determining resistance and/or capacity values
The oscillator frequency is varied until the measurement value for the number of time periods to charge or discharge a capacitor to a reference value equal to a set value stored in microcontroller memory. A value for a measured resistance or capacitance is then derived from the measured oscillator f...
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| Format: | Patent |
| Sprache: | eng ; fre ; ger |
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| Zusammenfassung: | The oscillator frequency is varied until the measurement value for the number of time periods to charge or discharge a capacitor to a reference value equal to a set value stored in microcontroller memory. A value for a measured resistance or capacitance is then derived from the measured oscillator frequency. |
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