A system and process for analysing surface defects

A system and process for analysing surface defects

The system may be used for three-dimensional analysis of surface defects and microdefects performed by correlating two images of the surface according to the general criteria of stereoscopic vision. The system may be implemented by integrating, in a single monolithic component made using VLSI CMOS t...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: BRANCIFORTE, MARCO, SPOTO, GIUSEPPE, DODDO, FRANCESCO, OCCHIPINTI, LUIGI
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
TESTING
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Beschreibung
Zusammenfassung:The system may be used for three-dimensional analysis of surface defects and microdefects performed by correlating two images of the surface according to the general criteria of stereoscopic vision. The system may be implemented by integrating, in a single monolithic component made using VLSI CMOS technology, an optical sensor with a cellular neural network comprising a matrix of cells configured as analog processors.