Spacer spring force adjustment tool and method of adjusting the spacer spring force

An adjustment tool (10) is provided, having a probe (18), a head (16), an arm (44) and a micrometer (22) attached to the head. With the probe inserted into a spacer cell opening, the micrometer handle is rotated to a predetermined setting to pivot the arm. The opposite end (50) of the arm from its e...

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Bibliographische Detailangaben
Hauptverfasser:	SMITH, DAVID GREY, PETERS, WILLIAM CARTER, GAYLORD, WILLIAM BECKWITH JR
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS NUCLEAR ENGINEERING NUCLEAR PHYSICS NUCLEAR REACTORS PHYSICS REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGYGENERATION, TRANSMISSION OR DISTRIBUTION TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE
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Beschreibung
Zusammenfassung:	An adjustment tool (10) is provided, having a probe (18), a head (16), an arm (44) and a micrometer (22) attached to the head. With the probe inserted into a spacer cell opening, the micrometer handle is rotated to a predetermined setting to pivot the arm. The opposite end (50) of the arm from its engagement with the micrometer drive head engages and displaces the spring (40) of the spacer cell to adjust its spring force. In one form, the arm (44) is housed within the probe (18) and the micrometer drive head displaces the distal end of the arm outwardly to correspondingly displace the spring outwardly, thereby decreasing the spring force. In another form of the spacer tool, the arm is spaced from the probe and has pivotal contact surfaces to straddle the spring. Movement of the drive head by rotating the micrometer handle to a predetermined setting causes the spring to be displaced inwardly of the spacer cell opening to increase the spacer spring force.