TEMPERATURE CONTROL FOR MICROSCOPY

A temperature control unit provides means for observing samples under microscopy at greatly elevated and greatly reduced temperatures. The temperature control unit is constructed to insulate a sample from ambient temperatures while providing a highly heat conductive substrate for the sample that pro...

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Bibliographische Detailangaben
Hauptverfasser:	MARTENY, PERRY, MARCELLI, ANGELA, MARIE, ARNOLD, WILLIAM, ALLEN
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] CONTROLLING MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS REGULATING SCANNING-PROBE TECHNIQUES OR APPARATUS SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES TESTING
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Beschreibung
Zusammenfassung:	A temperature control unit provides means for observing samples under microscopy at greatly elevated and greatly reduced temperatures. The temperature control unit is constructed to insulate a sample from ambient temperatures while providing a highly heat conductive substrate for the sample that provides for rapid heat transfer to/from the sample. A dry gas provides a positive pressure around the sample, as compared to atmospheric pressure to help prevent atmospheric contract with the sample.