Method for forming a dram capacitor and capacitor made thereby
An integrated DRAM cell comprises a DRAM capacitor and a transistor. The capacitor (17,18,20) of the cell is formed in a first well (16) in a dielectric layer (13) overlying the cell transistor. The top electrode (20) of the capacitor also serves as a barrier layer between an underlying plug (15) in...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | An integrated DRAM cell comprises a DRAM capacitor and a transistor. The capacitor (17,18,20) of the cell is formed in a first well (16) in a dielectric layer (13) overlying the cell transistor. The top electrode (20) of the capacitor also serves as a barrier layer between an underlying plug (15) in a second well (19) in the dielectric layer. A method of forming the cell comprises the step of using a single mask for formation of the layer which acts as both the top electrode of the capacitor and the barrier layer of the second well. |
---|