Non-contacting position sensor using bi-polar tapered magnets

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Bibliographische Detailangaben
Hauptverfasser:	DUESLER, JOHN S, NEWMAN, ROBERT L, MILLER, DAVID J, JARRARD, CRAIG A, NONNENMACHER, RONALD C, PFAFFENBERGER, DAVID S
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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