Chemically amplified positive photoresist composition

Disclosed is a chemical amplification positive amplification which can be formed into resist patterns much improved in transparency, photosensitivity and resolution and is suitable to KrF and ArF excimer lasers, enabling a submicrolithography process to be as exquisite as 0.2 mu m or less. This comp...

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Bibliographische Detailangaben
Hauptverfasser: KIM, SEONG-JU, PARK, JOO-HYEON, PARK, SUN-YI, SEO, DONGUL
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:Disclosed is a chemical amplification positive amplification which can be formed into resist patterns much improved in transparency, photosensitivity and resolution and is suitable to KrF and ArF excimer lasers, enabling a submicrolithography process to be as exquisite as 0.2 mu m or less. This composition is based on a copolymer of the formula I, ranging, in polystyrene-reduced weight average molecular weight, from 3,000 to 50,000 with a molecular weight distribution (Mw/Mn) of 1.0 to 2.0, and a low molecular weight compound of the formula VI: