Capacitor comprising improved TaOx based dielectric

We have made the unexpected discovery that a dielectric layer (83) consisting essentially of Ta, Al, oxygen and nitrogen can have advantageous properties that make such a layer useful for thin film capacitors (80), typically capacitors for Si integrated circuits. For instance, a significantly greate...

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Hauptverfasser: SCHNEEMEYER, LYNN FRANCES, VAN DOVER, ROBERT BRUCE, FLEMING, ROBERT MCLEMORE
Format: Patent
Sprache:eng ; fre ; ger
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