TEMPERATURE COMPENSATED LOGARITHMIC DETECTOR

A temperature compensated logarithmic detector biased with a proportional to absolute temperature (PTAT) voltage produced in accordance with an area ratio of biasing transistors is disclosed. According to one implementation of the invention, the temperature compensated logarithmic detector includes...

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Bibliographische Detailangaben
1. Verfasser: JENSEN, BRENT, R
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:A temperature compensated logarithmic detector biased with a proportional to absolute temperature (PTAT) voltage produced in accordance with an area ratio of biasing transistors is disclosed. According to one implementation of the invention, the temperature compensated logarithmic detector includes biasing circuitry and a logarithmic detector cell. The biasing circuitry receives an input signal and produces a PTAT bias voltage from the input signal. The PTAT characteristic of the PTAT bias voltage is produced by an area ratio. The logarithmic detector cell converts the input signal to a logarithmic output signal in accordance with a logarithmic transfer function over a narrow range.