Device for non-contact measuring of positon and displacement

The system (2) has a luminous source (4) and a photo-sensitive sensor (6) designed to be displaced with respect to each other. The sensor is designed to generate, when it is illuminated by the beam (8) from the source, an electric signal representing the position of the source with respect to the se...

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Bibliographische Detailangaben
1. Verfasser:	FLASSAYER, CLAUDE
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS SEMICONDUCTOR DEVICES TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The system (2) has a luminous source (4) and a photo-sensitive sensor (6) designed to be displaced with respect to each other. The sensor is designed to generate, when it is illuminated by the beam (8) from the source, an electric signal representing the position of the source with respect to the sensor. The sensor has a number of layers deposited on a support (10) with a transparent high resistance layer (12) designed to form a potentiometer track and a photo-sensitive layer (14) designed to deliver electrical charges when it is illuminated by the beam from the source. A metallic layer (16) is designed to collect the electrical charges generated by the photo-sensitive layer. The photo-sensitive layer (14) has a PIN junction deposited between the high resistance layer (12) and the metallic layer (16) so as to form a photo-diode.