X-RAY EXAMINATION APPARATUS INCLUDING AN IMAGE SENSOR MATRIX WITH A CORRECTION UNIT

An X-ray examination apparatus utilizes an image sensor matrix for picking up an X-ray image, i.e. for converting incident X-rays into electric charges. The X-ray examination apparatus includes a control circuit for controlling the image sensor matrix so as to form a dark signal. The X-ray examinati...

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Bibliographische Detailangaben
Hauptverfasser: LUIJENDIJK, JOHANNES, ALBERT, STOUTEN, JOHANNES, JACOBUS, MEULENBRUGGE, HENDRIK, JAN, ALVING, PETER, LEX
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:An X-ray examination apparatus utilizes an image sensor matrix for picking up an X-ray image, i.e. for converting incident X-rays into electric charges. The X-ray examination apparatus includes a control circuit for controlling the image sensor matrix so as to form a dark signal. The X-ray examination apparatus also includes a correction unit which is arranged to derive the electronic image signal from the primary image and the dark signal. The electronic image signal represents image information in the X-ray image and has not been disturbed by electric charges which have been read with a delay.