A method of determining contact quality and line integrity in a TFT/LCD array tester

A method for testing a TFT/LCD array comprising the steps of applying gate pulses to the driven end of gate lines; observing the presence of a corresponding signature pulse on a first data line near the driven end and a second data line at the end opposite the driven end so as to indicate a gate lin...

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Bibliographische Detailangaben
Hauptverfasser:	WISNIEFF, ROBERT LUKE, ICHIOKA, YOSHIKAZU, TROUTMAN, RONALD ROY, KIMURA, SHINICHI, JENKINS, LESLIE CHARLES, POLASTRE, ROBERT JOHN
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CRYPTOGRAPHY DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING DISPLAY EDUCATION FREQUENCY-CHANGING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS SEALS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING
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