A method of determining contact quality and line integrity in a TFT/LCD array tester

A method for testing a TFT/LCD array comprising the steps of applying gate pulses to the driven end of gate lines; observing the presence of a corresponding signature pulse on a first data line near the driven end and a second data line at the end opposite the driven end so as to indicate a gate line that is continuous; and testing successive gate lines as above to determine the top most and bottom most continuous gate lines. The integrity of all data lines is evaluated by using the top most and bottom most gate lines having integrity. The integrity of the data lines is determined in an analogous manner. A method for testing probe contact integrity to electrodes on a TFT/LCD display comprising the steps of providing an electrically conductive connection ring for the electrodes; providing an electrical connection between the connection ring and each of the electrodes; applying electrically conductive probe contacts to at least two of the electrodes; applying a voltage between the two probe contacts; and measuring the current between the contacts to determine the quality of electrical continuity between the probe contacts and the electrodes. An apparatus for testing for and classifying defects in a TFT/LCD array having gate lines and data lines comprising means for activating cells of the array by applying gate pulses to the gate lines and pulses to the data lines; means for acquiring waveforms from data lines of the array, means for sampling the waveforms at selected points in time, and means for classifying the waveforms to indicate of whether defects are present and if present, the nature of the defects comparing voltages of the waveform at the selected points in time.