Plasma treatment method and apparatus

In a plasma treatment method and apparatus that can etch fine and deep grooves and holes at high speeds in a high vacuum, the gas pressure is set to less than 5 mTorr, the gas flow rate to more than 40 sccm, and the time that the reactive gas stays in the chamber to less than 300 msec. A high etchin...

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Bibliographische Detailangaben
Hauptverfasser: KUMIHASHI, TAKAO, TACHI, SHINICHI, KOBAYASHI, JUNICHI, TSUJIMOTO, KAZUNORI, KANETOMO, MASAFUMI, MISE, NOBUYUKI, USUI, TATEHITO
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:In a plasma treatment method and apparatus that can etch fine and deep grooves and holes at high speeds in a high vacuum, the gas pressure is set to less than 5 mTorr, the gas flow rate to more than 40 sccm, and the time that the reactive gas stays in the chamber to less than 300 msec. A high etching speed of more than 1,000 nm/min can be achieved while maintaining good directionality of ions. High exhaust speeds are used for the vacuum chamber.