Continuous contact-free thickness measuring device for thin conductive films on an insulating substrate, such as a moving fibre or band

Bibliographische Detailangaben

Hauptverfasser:	BONIORT, JEAN-YVES, ROUSSY, GEORGES
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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