MULTI-ELEMENT SIMULTANEOUS ANALYSIS ATOMIC ABSORPTION SPECTROSCOPY PHOTOMETER AND MULTI-ELEMENT SIMULTANEOUS ANALYTIC METHOD
Incident slits (W1 - W4) and exiting slits (W5 - W8) are provided separately on the corresponding optical axes (a/ &cir& , b/ &cir& , c/ &cir& , d/ &cir& ) incident simultaneously on a spectroscope (10) from a sample atomizing unit (7). A mechanism (11a - 11d, 31a - 3...
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creator | TSUKADA, MASAMICHI OISHI, KONOSUKE |
description | Incident slits (W1 - W4) and exiting slits (W5 - W8) are provided separately on the corresponding optical axes (a/ &cir& , b/ &cir& , c/ &cir& , d/ &cir& ) incident simultaneously on a spectroscope (10) from a sample atomizing unit (7). A mechanism (11a - 11d, 31a - 31d; 17a, 17b, 31e, 31f) for changing the widths of the respective incident slits (W1 - W4( and exiting slits (W5 - W8) is provided such that the slit widths optimal to the respective elements to be measured are set on the corresponding optical axes to thereby realize high sensitivity analysis of all the elements to be measured simultaneously. |
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A mechanism (11a - 11d, 31a - 31d; 17a, 17b, 31e, 31f) for changing the widths of the respective incident slits (W1 - W4( and exiting slits (W5 - W8) is provided such that the slit widths optimal to the respective elements to be measured are set on the corresponding optical axes to thereby realize high sensitivity analysis of all the elements to be measured simultaneously.]]></description><edition>5</edition><language>eng</language><subject>COLORIMETRY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>1991</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19911227&DB=EPODOC&CC=EP&NR=0423736A3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19911227&DB=EPODOC&CC=EP&NR=0423736A3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TSUKADA, MASAMICHI</creatorcontrib><creatorcontrib>OISHI, KONOSUKE</creatorcontrib><title>MULTI-ELEMENT SIMULTANEOUS ANALYSIS ATOMIC ABSORPTION SPECTROSCOPY PHOTOMETER AND MULTI-ELEMENT SIMULTANEOUS ANALYTIC METHOD</title><description><![CDATA[Incident slits (W1 - W4) and exiting slits (W5 - W8) are provided separately on the corresponding optical axes (a/ &cir& , b/ &cir& , c/ &cir& , d/ &cir& ) incident simultaneously on a spectroscope (10) from a sample atomizing unit (7). A mechanism (11a - 11d, 31a - 31d; 17a, 17b, 31e, 31f) for changing the widths of the respective incident slits (W1 - W4( and exiting slits (W5 - W8) is provided such that the slit widths optimal to the respective elements to be measured are set on the corresponding optical axes to thereby realize high sensitivity analysis of all the elements to be measured simultaneously.]]></description><subject>COLORIMETRY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1991</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjLEKAjEQRNNYiPoP-wMHYkTrmFtJIMmGZK-46jgkVqIHZ-nHG8Feq5mBN28pXr5zbBt06DEwZPvZKiB1GVRQrs-2FiZvNahTphTZUoAcUXOirCn2EA1VABlTvbTwy8hVVWlD7VosruNtLptvrgSckbVpyvQYyjyNl3IvzwHjdr-TR3lQUv6BvAHT5Tv3</recordid><startdate>19911227</startdate><enddate>19911227</enddate><creator>TSUKADA, MASAMICHI</creator><creator>OISHI, KONOSUKE</creator><scope>EVB</scope></search><sort><creationdate>19911227</creationdate><title>MULTI-ELEMENT SIMULTANEOUS ANALYSIS ATOMIC ABSORPTION SPECTROSCOPY PHOTOMETER AND MULTI-ELEMENT SIMULTANEOUS ANALYTIC METHOD</title><author>TSUKADA, MASAMICHI ; OISHI, KONOSUKE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP0423736A33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1991</creationdate><topic>COLORIMETRY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TSUKADA, MASAMICHI</creatorcontrib><creatorcontrib>OISHI, KONOSUKE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TSUKADA, MASAMICHI</au><au>OISHI, KONOSUKE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MULTI-ELEMENT SIMULTANEOUS ANALYSIS ATOMIC ABSORPTION SPECTROSCOPY PHOTOMETER AND MULTI-ELEMENT SIMULTANEOUS ANALYTIC METHOD</title><date>1991-12-27</date><risdate>1991</risdate><abstract><![CDATA[Incident slits (W1 - W4) and exiting slits (W5 - W8) are provided separately on the corresponding optical axes (a/ &cir& , b/ &cir& , c/ &cir& , d/ &cir& ) incident simultaneously on a spectroscope (10) from a sample atomizing unit (7). A mechanism (11a - 11d, 31a - 31d; 17a, 17b, 31e, 31f) for changing the widths of the respective incident slits (W1 - W4( and exiting slits (W5 - W8) is provided such that the slit widths optimal to the respective elements to be measured are set on the corresponding optical axes to thereby realize high sensitivity analysis of all the elements to be measured simultaneously.]]></abstract><edition>5</edition><oa>free_for_read</oa></addata></record> |
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subjects | COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
title | MULTI-ELEMENT SIMULTANEOUS ANALYSIS ATOMIC ABSORPTION SPECTROSCOPY PHOTOMETER AND MULTI-ELEMENT SIMULTANEOUS ANALYTIC METHOD |
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