MULTI-ELEMENT SIMULTANEOUS ANALYSIS ATOMIC ABSORPTION SPECTROSCOPY PHOTOMETER AND MULTI-ELEMENT SIMULTANEOUS ANALYTIC METHOD

MULTI-ELEMENT SIMULTANEOUS ANALYSIS ATOMIC ABSORPTION SPECTROSCOPY PHOTOMETER AND MULTI-ELEMENT SIMULTANEOUS ANALYTIC METHOD

Incident slits (W1 - W4) and exiting slits (W5 - W8) are provided separately on the corresponding optical axes (a/ &cir& , b/ &cir& , c/ &cir& , d/ &cir& ) incident simultaneously on a spectroscope (10) from a sample atomizing unit (7). A mechanism (11a - 11d, 31a - 3...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: TSUKADA, MASAMICHI, OISHI, KONOSUKE
Format: Patent
Sprache:eng
Schlagworte:
COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Incident slits (W1 - W4) and exiting slits (W5 - W8) are provided separately on the corresponding optical axes (a/ &cir& , b/ &cir& , c/ &cir& , d/ &cir& ) incident simultaneously on a spectroscope (10) from a sample atomizing unit (7). A mechanism (11a - 11d, 31a - 31d; 17a, 17b, 31e, 31f) for changing the widths of the respective incident slits (W1 - W4( and exiting slits (W5 - W8) is provided such that the slit widths optimal to the respective elements to be measured are set on the corresponding optical axes to thereby realize high sensitivity analysis of all the elements to be measured simultaneously.