MEASURING CIRCUIT FOR EVALUATING MEASURING SIGNALS

For ultra-high precision measurements, a control loop which consists of a controlled system (S), a nominal/actual value comparator (V) and a controller (R), is extended in such a manner that, for the purpose of detecting measurement signals, the connection (LWL) carrying the controlled variable betw...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	ZIMMERMANN, CLIFTON, LEWIN, HELMUT, KUERTEN, HERIBERT
Format:	Patent
Sprache:	eng ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	For ultra-high precision measurements, a control loop which consists of a controlled system (S), a nominal/actual value comparator (V) and a controller (R), is extended in such a manner that, for the purpose of detecting measurement signals, the connection (LWL) carrying the controlled variable between the controller output and the controlled-system input is carried via a measurement value transducer (G). To evaluate and indicate the measurement value, the output of the controller carrying the manipulated variable (Y) is additionally connected to an evaluating circuit (A).