NEAR INFRARED POLYETHYLENE INSPECTION SYSTEM AND METHOD

A sample inspection arrangement incorporates a sample of natural polyethylene with an included defect, or flaw, a light source containing near infrared wavelengths, and a video camera. Natural polyethylene has relatively high spectral transmissivity for wavelengths in the band of near infrared wavel...

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Bibliographische Detailangaben
Hauptverfasser:	STIX, MARSHA SPALDING, ORTIZ, MARCOS GERMAN
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CABLES CONDUCTORS ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY INSULATORS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES TESTING
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Beschreibung
Zusammenfassung:	A sample inspection arrangement incorporates a sample of natural polyethylene with an included defect, or flaw, a light source containing near infrared wavelengths, and a video camera. Natural polyethylene has relatively high spectral transmissivity for wavelengths in the band of near infrared wavelengths. The video camera collects data from a beam of the near infrared light which either reflects from or is transmitted directly through a portion of the natural polyethylene sample. Data is collected from both defect free portions of the polyethylene sample and portions of polyethylene sample including at least one defect. A visual image of the polyethylene sample and included defect is produced on either a video monitor, a paper print out, or a photograph. The method for inspecting a sample of cable or a continuously moving section of cable also is described.