Method and apparatus for detecting position/variance of input light

An apparatus for detecting position/variance of input light is disclosed which comprises a photoelectric conversion device receiving input light constituted of a first resistive layer formed of a first photoelectric conversion material and a second resistive layer formed of a second photoelectric co...

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Bibliographische Detailangaben
Hauptverfasser:	NAKAI, YASUHIDE, KUSAKA, TAKUYA, NISHIMOTO, YOSHIRO, YONEDA, YASUJI, IMAOKA, SHINICHI, NAKAUE, AKIMITSU, NISHIMURA, KOZO, ONISHI, YOSHIHIKO, INOUE, TAKAYOSHI, TACHIBANA, HIROYUKI, TOJYO, SHIGEKI, TAKAMATSU, HIROYUKI, KAJIKAWA, HIROSHI
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ANALOGOUS ARRANGEMENTS USING OTHER WAVES BASIC ELECTRIC ELEMENTS DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS RADIO DIRECTION-FINDING RADIO NAVIGATION SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	An apparatus for detecting position/variance of input light is disclosed which comprises a photoelectric conversion device receiving input light constituted of a first resistive layer formed of a first photoelectric conversion material and a second resistive layer formed of a second photoelectric conversion material connected with the first resistive layer through a depletion layer or directly, wherein the first resistive layer is provided with uniform resistivity throughout its surface so that a linear output proportional to the average of the distances between one end of the photoelectric conversion device and positions of the input light is detected and the second resistive layer is provided with resistivity dependent upon the distance from its one end so that a quadratic output proportional to the average of the squares of the distances between one end of the photoelectric conversion device and positions of the input light is detected.