EQUIPMENT FOR MEASURING DEFORMATIONS OF PROBES OR TEST SAMPLES IN TESTING MACHINES

A process is proposed for measuring deformations of specimens in testing machines, having a light source (1) and a signal processing device (8), as well as equipment for carrying out the process. The process is characterised in that at least one mirror (6, 6'; 6a, b; 11a, b) is arranged at suit...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: TREUSCH, WERNER, HINTZ, GERHARD, JATHO, RALF, KELLER, GUENTER, ZOELLER, KARL, GERNHART, PETER
Format: Patent
Sprache:eng ; ger
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Beschreibung
Zusammenfassung:A process is proposed for measuring deformations of specimens in testing machines, having a light source (1) and a signal processing device (8), as well as equipment for carrying out the process. The process is characterised in that at least one mirror (6, 6'; 6a, b; 11a, b) is arranged at suitable points of the specimen (4) or at least one component connected to the specimen (4) or the test sample, the beam (2) of the light source (1) is directed onto the mirror (6, 6'; 6a, b; 11a, b), the beam reflected from the mirror is directed onto a position detector (7), and the position of the beam incident on the position detector (7) is determined and evaluated in evaluation electronics (8). Equipment for carrying out the process is specified. Using the process and the equipment for measuring deformations, it is possible to measure static and/or dynamic deformations due to tensile and compressive forces, as well as deformations owing to torques and bending moments. Moreover, it is possible at the same time to measure several types of deformation.