TELESCOPING PIN PROBE

A probe for use in electrical circuit test equipment, in which a contact element (30) is longitudinally slidable in an insulator sleeve (32) which also contains an R-C attenuator circuit (34) connected electrically to the contact element (30) by an electrically conductive elastomeric material (36)....

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HARRY, EMORY J, GARCIA, JOHN D, HADWIN, MATTHEW J
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CURRENT COLLECTORS ELECTRICITY LINE CONNECTORS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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