TELESCOPING PIN PROBE

TELESCOPING PIN PROBE

A probe for use in electrical circuit test equipment, in which a contact element (30) is longitudinally slidable in an insulator sleeve (32) which also contains an R-C attenuator circuit (34) connected electrically to the contact element (30) by an electrically conductive elastomeric material (36)....

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HARRY, EMORY J, GARCIA, JOHN D, HADWIN, MATTHEW J
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
CURRENT COLLECTORS
ELECTRICITY
LINE CONNECTORS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A probe for use in electrical circuit test equipment, in which a contact element (30) is longitudinally slidable in an insulator sleeve (32) which also contains an R-C attenuator circuit (34) connected electrically to the contact element (30) by an electrically conductive elastomeric material (36). A high impedance cable is connected electrically to the other end of the RC attenuator circuit (34) by another piece of conductive elastomeric material (38). The cable connects the attenuator to another R-C circuit which, together with the attenuator, forms a voltage divider, and the attenuated signal controls an amplifier which provides a signal through a low impedance cable to a test equipment.