Scanning microscope

An optical scanning microscope in which light from a laser source (1) is focussed onto an object (3) and is collected by a detector. The detector has a radiation sensitive area which is split into two parts (6, 7) by a dividing line crossing the radiation axis of the microscope. That part of the rad...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	SHEPPARD, COLIN JAMES RICHARD, WILSON, TONY
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	An optical scanning microscope in which light from a laser source (1) is focussed onto an object (3) and is collected by a detector. The detector has a radiation sensitive area which is split into two parts (6, 7) by a dividing line crossing the radiation axis of the microscope. That part of the radiation sensitive area (6, 7) which is close to the axis is obscured. Various ways of doing this are discussed in the text; one way is a simple stop (8), such as that shown, which has an annular cut-out, thus giving an effective radiation sensitive area of annular shape. This has been found to improve the imaging performance of the detector.