Apparatus for scanning a test element

Apparatus comprising a reflectometer (20) having a contact face (27) which contacts a test element (E) during scanning of the element (E). A removing means (50) is provided for firstly moving a scanned test element (E) and the contact face (27) out of contact with each other and then pushing the tes...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	SCHNIPELSKY, PAUL NICHOLAS, JAKUBOWICZ, RAYMOND FRANCIS
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	Apparatus comprising a reflectometer (20) having a contact face (27) which contacts a test element (E) during scanning of the element (E). A removing means (50) is provided for firstly moving a scanned test element (E) and the contact face (27) out of contact with each other and then pushing the test element (E) away from the contact face (27) and out of the scanning position.