AUTOMATISERET DATAOVERLEJRING I INDUSTRIELLE MONITORERINGSSYSTEMER
Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest (150,151) in a plot corresponding to a first sensor. Additionally, the systems and methods...
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description | Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest (150,151) in a plot corresponding to a first sensor. Additionally, the systems and methods include matching the first feature of interest (150,151) with corresponding second features of interest (154,155) in a second plot. Furthermore, the systems and methods include overlaying the first plot with the second plot based at least in part on the first feature of interest (150,151) and the corresponding second feature of interest (154,155). |
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Furthermore, the systems and methods include overlaying the first plot with the second plot based at least in part on the first feature of interest (150,151) and the corresponding second feature of interest (154,155).</description><language>dan</language><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC ORINFRASONIC WAVES ; MEASURING ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220912&DB=EPODOC&CC=DK&NR=2975480T3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220912&DB=EPODOC&CC=DK&NR=2975480T3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Williams, Scott Terrell</creatorcontrib><title>AUTOMATISERET DATAOVERLEJRING I INDUSTRIELLE MONITORERINGSSYSTEMER</title><description>Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest (150,151) in a plot corresponding to a first sensor. Additionally, the systems and methods include matching the first feature of interest (150,151) with corresponding second features of interest (154,155) in a second plot. Furthermore, the systems and methods include overlaying the first plot with the second plot based at least in part on the first feature of interest (150,151) and the corresponding second feature of interest (154,155).</description><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC ORINFRASONIC WAVES</subject><subject>MEASURING</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHByDA3x93UM8Qx2DXINUXBxDHH0D3MN8nH1CvL0c1fwVPD0cwkNDgnydPXxcVXw9ffzDPEPcgXJBQdHBoe4-roG8TCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeBdvI0tzUxMLg5AQY2Ni1AAAglcssA</recordid><startdate>20220912</startdate><enddate>20220912</enddate><creator>Williams, Scott Terrell</creator><scope>EVB</scope></search><sort><creationdate>20220912</creationdate><title>AUTOMATISERET DATAOVERLEJRING I INDUSTRIELLE MONITORERINGSSYSTEMER</title><author>Williams, Scott Terrell</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_DK2975480TT33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>dan</language><creationdate>2022</creationdate><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC ORINFRASONIC WAVES</topic><topic>MEASURING</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Williams, Scott Terrell</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Williams, Scott Terrell</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>AUTOMATISERET DATAOVERLEJRING I INDUSTRIELLE MONITORERINGSSYSTEMER</title><date>2022-09-12</date><risdate>2022</risdate><abstract>Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. 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subjects | CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC ORINFRASONIC WAVES MEASURING MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TESTING |
title | AUTOMATISERET DATAOVERLEJRING I INDUSTRIELLE MONITORERINGSSYSTEMER |
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