AUTOMATISERET DATAOVERLEJRING I INDUSTRIELLE MONITORERINGSSYSTEMER

Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest (150,151) in a plot corresponding to a first sensor. Additionally, the systems and methods...

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Bibliographische Detailangaben
1. Verfasser:	Williams, Scott Terrell
Format:	Patent
Sprache:	dan
Schlagworte:	CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC ORINFRASONIC WAVES MEASURING MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TESTING
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Beschreibung
Zusammenfassung:	Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest (150,151) in a plot corresponding to a first sensor. Additionally, the systems and methods include matching the first feature of interest (150,151) with corresponding second features of interest (154,155) in a second plot. Furthermore, the systems and methods include overlaying the first plot with the second plot based at least in part on the first feature of interest (150,151) and the corresponding second feature of interest (154,155).